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Proceedings Paper

Changes in speckle patterns induced by load application onto an optical fiber and its possible application for sensing purpose
Author(s): Makoto Hasegawa; Jyun-ya Okumura; Akio Hyuga
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Paper Abstract

Speckle patterns to be observed in an output light spot from an optical fiber are known to be changed due to external disturbances applied onto the optical fiber. In order to investigate possibilities of utilizing such changes in speckle patterns for sensing application, a certain load was applied onto a jacket-covered communication-grade multi-mode glass optical fiber through which laser beams emitted from a laser diode were propagating, and observed changes in speckle patterns in the output light spot from the optical fiber were investigated both as image data via a CCD camera and as an output voltage from a photovoltaic panel irradiated with the output light spot. The load was applied via a load application mechanism in which several ridges were provided onto opposite flat plates and a certain number of weights were placed there so that corrugated bending of the optical fiber was intentionally induced via load application due to the ridges. The obtained results showed that the number of speckles in the observed pattern in the output light spot as well as the output voltage from the photovoltaic panel irradiated with the output light spot showed decreases upon load application with relatively satisfactory repeatability. When the load was reduced, i.e., the weights were removed, the number of speckles then showed recovery. These results indicate there is a certain possibility of utilizing changes in speckle patterns for sensing of load application onto the optical fiber.

Paper Details

Date Published: 10 August 2015
PDF: 8 pages
Proc. SPIE 9620, 2015 International Conference on Optical Instruments and Technology: Optical Sensors and Applications, 962009 (10 August 2015); doi: 10.1117/12.2185086
Show Author Affiliations
Makoto Hasegawa, Chitose Institute of Science and Technology (Japan)
Jyun-ya Okumura, Chitose Institute of Science and Technology (Japan)
Akio Hyuga, Chitose Institute of Science and Technology (Japan)


Published in SPIE Proceedings Vol. 9620:
2015 International Conference on Optical Instruments and Technology: Optical Sensors and Applications
Xuping Zhang; David Erickson; Xudong Fan; Zhongping Chen, Editor(s)

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