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Proceedings Paper

Adapted waveform analysis, wavelet packets, and local cosine libraries as a tool for image processing
Author(s): Ronald Raphael Coifman; Lionel J. Woog
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Paper Abstract

Adapted wave form analysis, refers to a collection of FFT like adapted transform algorithms. Given an image these methods provide special matched collections of templates (orthonormal bases) enabling an efficient coding of the image. Perhaps the closest well known example of such coding method is provided by musical notation, where each segment of music is represented by a musical score made up of notes (templates) characterised by their duration, pitch, location and amplitude, our method corresponds to transcribing the music in as few notes as possible. The extension to images and video is straightforward we describe the image by collections of oscillatory patterns (paint brush strokes)of various sizes locations and amplitudes using a variety of orthogonal bases. These selected basis functions are chosen inside predefined libraries of oscillatory localized functions (trigonometric and wavelet-packets waveforms) so as to optimize the number of parameters needed to describe our object. These algorithms are of complexity N log N opening the door for a large range of applications in signal and image processing, such as compression, feature extraction denoising and enhancement. In particular we describe a class of special purpose compressions for fingerprint irnages, as well as denoising tools for texture and noise extraction. We start by relating traditional Fourier methods to wavelet, wavelet-packet based algorithms using a recent refinement of the windowed sine and cosine transforms. We will then derive an adapted local sine transform show it's relation to wavelet and wavelet-packet analysis and describe an analysis toolkit illustrating the merits of different adaptive and nonadaptive schemes.

Paper Details

Date Published: 1 September 1995
PDF: 9 pages
Proc. SPIE 2567, Investigative and Trial Image Processing, (1 September 1995); doi: 10.1117/12.218485
Show Author Affiliations
Ronald Raphael Coifman, Yale Univ. (United States)
Lionel J. Woog, Yale Univ. (United States)


Published in SPIE Proceedings Vol. 2567:
Investigative and Trial Image Processing
Leonid I. Rudin; Simon K. Bramble, Editor(s)

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