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Proceedings Paper

Discrete Modal Decomposition for surface appearance modelling and rendering
Author(s): Gilles Pitard; Gaëtan Le Goïc; Hugues Favrelière; Serge Samper; Simon-Frédéric Desage; Maurice Pillet
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Paper Abstract

Controlling surface appearance has become essential in the supplier/customer relationship. In this context, many industries have implemented new methods to improve the sensory inspection, particularly in terms of variability. A trend is to develop both hardware and methods for moving towards the automation of appearance inspection and analysis. If devices inspired from dimensional control solutions generally allow to identify defects far apart the expected quality of products, it do not allow to quantify finely appearance anomalies, and decide on their acceptance.

To address this issue, new methods devoted to appearance modelling and rendering have been implemented, such as the Reflectance Transformation Imaging (RTI) technique. By varying the illumination positions, the RTI technique aims at enriching the classical information conveyed by images. Thus each pixel is described by a set of values rather than one value classically; each value corresponding to a specific illumination position. This set of values could be interpolated or approximated by a continuous model (function), associated to the reflectance of the pixel, generally based on a second order polynomial (namely, Polynomial Texture Mapping Technique). This paper presents a new approach to evaluate this information from RTI acquisitions. A modal projection based on dynamics (Discrete Modal Decomposition) is used to estimate surface reflectance on each measurement point. After presenting the acquisition device, an application on an industrial surface is proposed in order to validate the approach, and compare it to the more classical polynomial transformation. Results show that the proposed projection basis not only provides closer assessment of surface reflectance (modelling) but also yields to a more realistic rendering.

Paper Details

Date Published: 22 June 2015
PDF: 10 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 952523 (22 June 2015); doi: 10.1117/12.2184840
Show Author Affiliations
Gilles Pitard, Lab. Systèmes et Matériaux pour la Mécantronique, Univ. de Savoie (France)
Gaëtan Le Goïc, Lab. Electronique, Informatique et Image, CNRS, Univ. de Bourgogne (France)
Hugues Favrelière, Lab. Systèmes et Matériaux pour la Mécantronique, Univ. de Savoie (France)
Serge Samper, Lab. Systèmes et Matériaux pour la Mécantronique, Univ. de Savoie (France)
Lab. de Recherche en Mécanique Appliquée, CNRS, Univ. de Rennes (France)
Simon-Frédéric Desage, Lab. Systèmes et Matériaux pour la Mécantronique, Univ. de Savoie (France)
Maurice Pillet, Lab. Systèmes et Matériaux pour la Mécantronique, Univ. de Savoie (France)


Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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