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Proceedings Paper

Rugged target standards for HSI remote sensing
Author(s): Mark Morey; Mary O'Neill; Mark Hahn; John DiBenedetto
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Paper Abstract

There is a need for stable test standards for many remote sensing applications that can be used both in the laboratory and in rugged test environments. Ideally these standards would be stable over time such that the same standard could be used from year to year for comparison of system performance. While ink-jet and spray gun methods can disperse controlled doses of dissolved analytes, methods to maintain particle size spectral variations are lacking. In addition, standards that are environmentally robust and stable over time are limited. As part of the recent Lighthouse work toward a Hyperspectral Imagery (HSI) proximal handheld sensor, Special Technologies Laboratory (STL) was tasked to do preliminary work toward a rugged, transportable, waterproof target board. This involved developing test standards using minerals of known particle sizes that have spectrally relevant features. Mineral powders were dispersed in binders that did not change their spectral characteristics. These standards were packaged such that they could be transported and used repeatedly. This paper discusses the methodology for developing this preliminary set of targets. Target sizes were limited to the proximal case, and further work is required to finalize the optimum binder and examine other possible appropriate minerals.

Paper Details

Date Published: 21 May 2015
PDF: 13 pages
Proc. SPIE 9461, Radar Sensor Technology XIX; and Active and Passive Signatures VI, 94611N (21 May 2015); doi: 10.1117/12.2184820
Show Author Affiliations
Mark Morey, National Security Technologies, LLC (United States)
Mary O'Neill, National Security Technologies, LLC (United States)
Mark Hahn, Howard Industries (United States)
John DiBenedetto, National Security Technologies, LLC (United States)

Published in SPIE Proceedings Vol. 9461:
Radar Sensor Technology XIX; and Active and Passive Signatures VI
G. Charmaine Gilbreath; Kenneth I. Ranney; Armin Doerry; Chadwick Todd Hawley, Editor(s)

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