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Proceedings Paper

Maximum power point search method for photovoltaic panels which uses a light sensor in the conditions of real shading and temperature
Author(s): Janusz Mroczka; Mariusz Ostrowski
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Paper Abstract

Disadvantages of photovoltaic panels are their low efficiency and non-linear current-voltage characteristic. Therefore it is necessary to apply the maximum power tracking systems which are dependent on the sun exposure and temperature. Trackers, that are used in photovoltaic systems, differ from each other in the speed and accuracy of tracking. Typically, in order to determine the maximum power point, trackers use measure of current and voltage. The perturb and observe algorithm or the incremental conductance method are frequent in the literature. The drawback of these solutions is the need to search the entire current-voltage curve, resulting in a significant loss of power in the fast-changing lighting conditions. Modern solutions use an additional measurement of temperature, short-circuit current or open circuit voltage in order to determine the starting point of one of the above methods, what decreases the tracking time. For this paper, a sequence of simulations and tests in real shading and temperature conditions for the investigated method, which uses additional light sensor to increase the speed of the perturb and observe algorithm in fast-changing illumination conditions was performed. Due to the non-linearity of the light sensor and the photovoltaic panel and the influence of temperature on the used sensor and panel characteristics, we cannot directly determine the relationship between them. For this reason, the tested method is divided into two steps. In the first step algorithm uses the correlation curve of the light sensor and current at the maximum power point and determines the current starting point with respect of which the perturb and observe algorithm is run. When the maximum power point is reached, in a second step, the difference between the starting point and the actual maximum power point is calculated and on this basis the coefficients of correlation curve are modified.

Paper Details

Date Published: 21 June 2015
PDF: 8 pages
Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95261L (21 June 2015); doi: 10.1117/12.2184818
Show Author Affiliations
Janusz Mroczka, Wroclaw Univ. of Technology (Poland)
Mariusz Ostrowski, Wroclaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 9526:
Modeling Aspects in Optical Metrology V
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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