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Proceedings Paper

Parallel aligned liquid crystal on silicon display based optical set-up for the generation of polarization spatial distributions
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Paper Abstract

Liquid Crystals on Silicon (LCOS) displays are a type of LCDs that work in reflection. Such devices, due to the double pass that the light beam performs through the LC cells, lead to larger phase modulation than transmissive LCDs with the same thickness. By taking advantage of this modulation capability exhibited by LCOS displays, we propose a new experimental set-up which is able to provide customized state of polarization spatial distributions just by means of a single LCOS display. To this aim, a double reflection on different halves of the display is properly performed. This fact is achieved by including a compact optical system that steers the light and performs a proper polarization plane rotation.

The set-up has been experimentally implemented and some experimental concerns are discussed. The suitability of the system is provided by generating different experimental spatial distributions of polarization. In this regard, well-known polarization distributions, as axial, azimuthal or spiral linear polarization patterns are here provided. Based on the excellent results obtained, the suitability of the system to generate different spatially variant distributions of polarization is validated.

Paper Details

Date Published: 21 June 2015
PDF: 10 pages
Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95261A (21 June 2015); doi: 10.1117/12.2184800
Show Author Affiliations
Irene Estévez, Univ. Autònoma de Barcelona (Spain)
Angel Lizana, Univ. Autònoma de Barcelona (Spain)
Xuejie Zheng, Univ. Autònoma de Barcelona (Spain)
Alba Peinado, Univ. Autònoma de Barcelona (Spain)
Claudio Ramírez, Univ. Autònoma de Barcelona (Spain)
Jose Luis Martínez, Univ. Miguel Hernández de Elche (Spain)
Andrés Márquez, Univ. de Alicante (Spain)
Ignacio Moreno, Univ. Miguel Hernández de Elche (Spain)
Juan Campos, Univ. Autònoma de Barcelona (Spain)


Published in SPIE Proceedings Vol. 9526:
Modeling Aspects in Optical Metrology V
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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