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Proceedings Paper

Metrological characterization of a large aperture Fizeau for x-ray mirrors measurement
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Paper Abstract

The European XFEL is a large facility under construction in Hamburg, Germany. It will provide a transversally fully coherent x-ray radiation with outstanding characteristics: high repetition rate (up to 2700 pulses with a 0.6 milliseconds long pulse train at 10Hz), short wavelength (down to 0.05 nm), short pulse (in the femtoseconds scale) and high average brilliance (1.61025 photons / s / mm2 / mrad2/ 0.1% bandwidth). Due to the very short wavelength and very high pulse energy, all the mirrors need to have high quality surface, to be very long, and at the same time to implement an effective cooling system. Matching these tight specifications and assessing them with high precision optical measurements is very challenging. In order to measure the mirrors and to characterize their interaction with the mechanical mounts, we equipped a Metrology Laboratory with a Large Aperture Fizeau. The system is a classical 100 mm diameter commercial Fizeau, with an additional expander providing a 300 mm diameter. Despite the commercial nature of the system, special care has been done in the polishing of the reference flats and in the expander quality. In this report, we show the preparation of the instrument, the calibration and the performance characterization, together with some preliminary results. We also describe the approach that we want to follow for the x-rays mirrors measurements. The final goal will be to characterize very long mirrors, almost 1 meter long, with nanometer accuracy.

Paper Details

Date Published: 21 June 2015
PDF: 7 pages
Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95260A (21 June 2015); doi: 10.1117/12.2184748
Show Author Affiliations
Maurizio Vannoni, European XFEL GmbH (Germany)
Idoia Freijo Martín, European XFEL GmbH (Germany)

Published in SPIE Proceedings Vol. 9526:
Modeling Aspects in Optical Metrology V
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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