Share Email Print
cover

Proceedings Paper

Measurement of concentration of sugar in solutions with laser speckle decorrelation
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Measurement of rotation of plane of polarization of linearly polarized light can provide information about the concentration of the optically active system with which it interacts. For substances containing sugar, accurate measurement of rotation of linearly polarized light can provide quantitative information about concentration of sugar in the material. Measurement of sugar concentration is important in areas ranging from blood sugar level measurement in body fluids to measurement of sugar concentrations in juices and other beverages. But in many of these cases, the changes introduced to the state of polarization considering a sample of practical proportion is low and the measurement of low optical rotations becomes necessary. So methods with higher sensitivity, accuracy and resolution need to be developed for the measurement of low optical rotations. Here we describe the development of a compact, low cost, field portable, device for rotation sensing leading to sugar concentration measurements, using speckle de-correlation technique. The developed device measures rotations by determining the changes occurring to a speckle pattern generated by a laser beam passing through the medium under investigation. The device consists of a sample chamber, a diode laser module, a ground glass diffuser and a digital sensor for recording of laser speckle patterns. The device was found to have high resolution and sensitivity.

Paper Details

Date Published: 22 June 2015
PDF: 6 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95253H (22 June 2015); doi: 10.1117/12.2184698
Show Author Affiliations
Swapnil Mahajan, The Maharaja Sayajirao Univ. of Baroda (India)
Vismay Trivedi, The Maharaja Sayajirao Univ. of Baroda (India)
Vani Chhaniwal, The Maharaja Sayajirao Univ. of Baroda (India)
Mahendra Prajapati, Shri P. N. Pandya Arts, M. P. Pandya Science, and D. P. Pandya Commerce College (India)
Zeev Zalevsky, Bar-Ilan Univ. (Israel)
Bahram Javidi, Univ. of Connecticut (United States)
Arun Anand, The Maharaja Sayajirao Univ. of Baroda (India)


Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

© SPIE. Terms of Use
Back to Top