Share Email Print

Proceedings Paper

Combination of topology and structural information for damages and deterioration analysis of artworks
Author(s): D. Buchta; N. Hein; G. Pedrini; C. Krekel; W. Osten
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Because artworks are a major part of our culture their preservation is of great importance and therefore they need to be protected from any damage. But the change of environmental conditions like temperature or humidity leads to internal stress, which can result in different defects like delaminations or cracks. The deteriorations occurring due to ageing or transport are often small and invisible, but they can enlarge and produce new irreversible damages. Therefore it is important to detect small changes in the surface as well as deteriorations under the surface. A combination of fringe projection and shearography data is a very suitable method to fulfill this task. While fringe projection is used to determine the surface structure, the shearography gives information about the strain occurring due to loading, which allows conclusions about weaknesses in the internal structure. We optimized both techniques for the use in the preservation of artwork and combined the resulting data by a mapping process. In this paper we present the advantages and also the limits, which need to overcome.

Paper Details

Date Published: 2 July 2015
PDF: 10 pages
Proc. SPIE 9527, Optics for Arts, Architecture, and Archaeology V, 95270Q (2 July 2015); doi: 10.1117/12.2184690
Show Author Affiliations
D. Buchta, Univ. Stuttgart (Germany)
N. Hein, Staatliche Akademie der Bildenden Künste Stuttgart (Germany)
G. Pedrini, Univ. Stuttgart (Germany)
C. Krekel, Staatliche Akademie der Bildenden Künste Stuttgart (Germany)
W. Osten, Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 9527:
Optics for Arts, Architecture, and Archaeology V
Luca Pezzati; Piotr Targowski, Editor(s)

© SPIE. Terms of Use
Back to Top