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Proceedings Paper

Optical detectors based on thermoelastic effect in crystalline quartz
Author(s): V. P. Chelibanov; G. G. Ishanin
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Paper Abstract

Optical detectors developed on base of thermo elastic effect In quartz crystalline (PTEK) attributed to the thermal detectors group. Such detectors occurred very effective for the registration of pulsed light energy or power of harmonically modulated laser radiation flux in a wide spectral (from UV to far IR) and dynamic ranges (from 10-6 to 300 W / cm2 with cooling) with a time constant up to10-6 seconds. When exposed to electromagnetic radiation occurs at the receiver thermal field which causes mechanical stress in the transient crystalline quartz, which in turn leads to a change in the polarization of crystalline quartz and, as a consequence, to an electric potential difference at the electrodes (the front surface with a conductive coating and damper). The capacitive characteristic of the detector, based on a thermo elastic effect in crystalline quartz, eliminates the possibility of working with constant flow of radiation, which also affects at the frequency response of the detector, since the potential difference appearance in the piezoelectric plate depends on the direction of the forces relative to the axes X, Y, Z of the crystal. Therefore, a certain choice of orientation of the receiving element is necessary in accordance with the physical properties of crystalline quartz. In this paper, a calculation of the sensitivity and frequency characteristics of optical detectors based on the thermo elastic effect in crystalline quartz at the harmonic effects of electromagnetic radiation flux are reported.

Paper Details

Date Published: 21 June 2015
PDF: 10 pages
Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95260D (21 June 2015); doi: 10.1117/12.2184671
Show Author Affiliations
V. P. Chelibanov, ITMO Univ. (Russian Federation)
G. G. Ishanin, ITMO Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 9526:
Modeling Aspects in Optical Metrology V
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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