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Proceedings Paper

Spatially revolved high density electroencephalography
Author(s): Jerry Wu; Harold Szu; Yuechen Chen; Ran Guo; Xixi Gu
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Paper Abstract

Electroencephalography (EEG) measures voltage fluctuations resulting from ionic current flows within the neurons of the brain. In practice, EEG refers to the recording of the brain's spontaneous electrical activity over a short period of time, several tens of minutes, as recorded from multiple electrodes placed on the scalp. In order to improve the resolution and the distortion cause by the hair and scalp, large array magnetoencephalography (MEG) systems are introduced. The major challenge is to systematically compare the accuracy of epileptic source localization with high electrode density to that obtained with sparser electrode setups. In this report, we demonstrate a two dimension (2D) image Fast Fourier Transform (FFT) analysis along with utilization of Peano (space-filling) curve to further reduce the hardware requirement for high density EEG and improve the accuracy and performance of the high density EEG analysis. The brain–computer interfaces (BCIs) in this work is enhanced by A field-programmable gate array (FPGA) board with optimized two dimension (2D) image Fast Fourier Transform (FFT) analysis.

Paper Details

Date Published: 3 June 2015
PDF: 10 pages
Proc. SPIE 9496, Independent Component Analyses, Compressive Sampling, Large Data Analyses (LDA), Neural Networks, Biosystems, and Nanoengineering XIII, 94960S (3 June 2015); doi: 10.1117/12.2184655
Show Author Affiliations
Jerry Wu, The George Washington Univ. (United States)
Harold Szu, The Catholic Univ. of America (United States)
Yuechen Chen, The George Washington Univ. (United States)
Ran Guo, The George Washington Univ. (United States)
Xixi Gu, The George Washington Univ. (United States)


Published in SPIE Proceedings Vol. 9496:
Independent Component Analyses, Compressive Sampling, Large Data Analyses (LDA), Neural Networks, Biosystems, and Nanoengineering XIII
Harold H. Szu; Liyi Dai; Yufeng Zheng, Editor(s)

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