Share Email Print
cover

Proceedings Paper

Absolute calibration of flats for densely sampled data
Author(s): Marie-Christine Zolcinski-Couet; Joseph A. Magner; David A. Zweig
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Results from a new technique for the absolute calibration of flats are presented. This technique is mathematically exact and, in addition, computationally nonintensive compared to previous techniques. Hence it allows the calibration of flats to a high degree of precision over the entire surface. The accuracy of this new technique is demonstrated through simulated test cases. This technique is currently implemented in the manufacturing cycle of optics (RMS precision of approximately (lambda) /250 at a wavelength of .6328 microns).

Paper Details

Date Published: 8 September 1995
PDF: 8 pages
Proc. SPIE 2536, Optical Manufacturing and Testing, (8 September 1995); doi: 10.1117/12.218463
Show Author Affiliations
Marie-Christine Zolcinski-Couet, Hughes Danbury Optical Systems, Inc. (United States)
Joseph A. Magner, Hughes Danbury Optical Systems, Inc. (United States)
David A. Zweig, Glenbrook Technologies (United States)


Published in SPIE Proceedings Vol. 2536:
Optical Manufacturing and Testing
Victor J. Doherty; H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top