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Proceedings Paper

Effect of wavefront aberrations on a focused plenoptic imaging system: a wave optics simulation approach
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Paper Abstract

A plenoptic imaging system records simultaneously the intensity and the direction of the rays of light. This additional information allows many post processing features such as 3D imaging, synthetic refocusing and potentially evaluation of wavefront aberrations. In this paper the effects of low order aberrations on a simple plenoptic imaging system have been investigated using a wave optics simulations approach.

Paper Details

Date Published: 21 June 2015
PDF: 8 pages
Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95260X (21 June 2015); doi: 10.1117/12.2184621
Show Author Affiliations
Massimo Turola, City Univ. London (United Kingdom)
Chris J. Meah, The Univ. of Birmingham (United Kingdom)
Richard J. Marshall, The Univ. of Birmingham (United Kingdom)
Iain B. Styles, The Univ. of Birmingham (United Kingdom)
Stephen Gruppetta, City Univ. London (United Kingdom)


Published in SPIE Proceedings Vol. 9526:
Modeling Aspects in Optical Metrology V
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

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