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Proceedings Paper

A calibration method of self-referencing interferometry based on maximum likelihood estimation
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Paper Abstract

Self-referencing interferometry has been widely used in wavefront sensing. However, currently the results of wavefront measurement include two parts, one is the real phase information of wavefront under test and the other is the system error in self-referencing interferometer. In this paper, a method based on maximum likelihood estimation is presented to calibrate the system error in self-referencing interferometer. Firstly, at least three phase difference distributions are obtained by three position measurements of the tested component: one basic position, one rotation and one lateral translation. Then, combining the three phase difference data and using the maximum likelihood method to create a maximum likelihood function, reconstructing the wavefront under test and the system errors by least square estimation and Zernike polynomials. The simulation results show that the proposed method can deal with the issue of calibration of a self-referencing interferometer. The method can be used to reduce the effect of system errors on extracting and reconstructing the wavefront under test, and improve the measurement accuracy of the self-referencing interferometer.

Paper Details

Date Published: 22 June 2015
PDF: 8 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95250X (22 June 2015); doi: 10.1117/12.2184591
Show Author Affiliations
Chen Zhang, Sichuan Univ. (China)
Dahai Li, Sichuan Univ. (China)
Mengyang Li, Sichuan Univ. (China)
Kewei E, Sichuan Univ. (China)
Guangrao Guo, Sichuan Univ. (China)


Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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