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Proceedings Paper

Algorithm for recognition and measurement position of pitches on invar scale with submicron accuracy
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Paper Abstract

High precision optical encoders are used for many high end computerized numerical control machines. Main requirement for such systems are accuracy and time of measurement, therefore image processing are often performed by FPGA or DSP. This article will describe image processing algorithm for detecting and measuring pitch position on invar scale, which can be easily implemented on specified target hardware. The paper proposed to use a one-dimensional approach for pitch recognition and measure its position on the image. This algorithm is well suited for implementation on FPGA and DSP and provide accuracy 0.07 pixel.

Paper Details

Date Published: 22 June 2015
PDF: 6 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95252U (22 June 2015); doi: 10.1117/12.2184523
Show Author Affiliations
Oleg Lashmanov, ITMO Univ. (Russian Federation)
Valery Korotaev, ITMO Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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