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Proceedings Paper

Detection and direct identification of liquid contaminants at standoff distances with an imaging polarimetric spectrometer
Author(s): Eugene Tsiang; Adam Oberbeck; Jason Akagi; Ed Knobbe
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Paper Abstract

We demonstrate a remote sensing method, based on an imaging polarimetric spectrometer, to determine the complex refractive index of materials. The approach represents an adaptation of a technique used in semiconductor ellipsometry. Our experimental demonstration setup comprises a Sagnac-type LWIR spatial interferometer (8 - 12 micron) designed for hyperspectral imaging in emission and reflection. The method facilitates direct measurement of the complex refractive index and the thickness of a layer. Presented work focuses on SF96, a liquid surrogate for toxic chemicals, but the method is generally applicable to solids, including soils, and to any substrate with a general bidirectional reflectance distribution function.

Paper Details

Date Published: 3 June 2015
PDF: 19 pages
Proc. SPIE 9482, Next-Generation Spectroscopic Technologies VIII, 94820Y (3 June 2015); doi: 10.1117/12.2184493
Show Author Affiliations
Eugene Tsiang, Spectrum Photonics, Inc. (United States)
Adam Oberbeck, Spectrum Photonics, Inc. (United States)
Jason Akagi, Spectrum Photonics, Inc. (United States)
Ed Knobbe, Spectrum Photonics, Inc. (United States)


Published in SPIE Proceedings Vol. 9482:
Next-Generation Spectroscopic Technologies VIII
Mark A. Druy; Richard A. Crocombe; David P. Bannon, Editor(s)

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