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Proceedings Paper

Metal ion sensing solution containing double crossover DNA
Author(s): Byeongho Park; Sreekantha Reddy Dugasani; Youngho Cho; Juyeong Oh; Chulki Kim; Min Ah Seo; Taikjin Lee; Young Miin Jhon; Deok Ha Woo; Seok Lee; Seong Chan Jun; Sung Ha Park; Jae Hun Kim
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Paper Abstract

The current study describes metal ion sensing with double crossover DNAs (DX1 and DX2), artificially designed as a platform of doping. The sample for sensing is prepared by a facile annealing method to grow the DXs lattice on a silicon/silicon oxide. Adding and incubating metal ion solution with the sensor substrate into the micro-tube lead the optical property change. Photoluminescence (PL) is employed for detecting the concentration of metal ion in the specimen. We investigated PL emission for sensor application with the divalent copper. In the range from 400 to 650 nm, the PL features of samples provide significantly different peak positions with excitation and emission detection. Metal ions contribute to modify the optical characteristics of DX with structural and functional change, which results from the intercalation of them into hydrogen bonding positioned at the center of double helix. The PL intensity is decreased gradually after doping copper ion in the DX tile on the substrate.

Paper Details

Date Published: 1 July 2015
PDF: 4 pages
Proc. SPIE 9655, Fifth Asia-Pacific Optical Sensors Conference, 96553A (1 July 2015); doi: 10.1117/12.2184390
Show Author Affiliations
Byeongho Park, Korea Institute of Science and Technology (Korea, Republic of)
Yonsei Univ. (Korea, Republic of)
Sreekantha Reddy Dugasani, Sungkyunkwan Univ. (Korea, Republic of)
Youngho Cho, Korea Institute of Science and Technology (Korea, Republic of)
Kookmin Univ. (Korea, Republic of)
Juyeong Oh, Korea Institute of Science and Technology (Korea, Republic of)
Chulki Kim, Korea Institute of Science and Technology (Korea, Republic of)
Min Ah Seo, Korea Institute of Science and Technology (Korea, Republic of)
Taikjin Lee, Korea Institute of Science and Technology (Korea, Republic of)
Young Miin Jhon, Korea Institute of Science and Technology (Korea, Republic of)
Deok Ha Woo, Korea Institute of Science and Technology (Korea, Republic of)
Seok Lee, Korea Institute of Science and Technology (Korea, Republic of)
Seong Chan Jun, Yonsei Univ. (Korea, Republic of)
Sung Ha Park, Sungkyunkwan Univ. (Korea, Republic of)
Jae Hun Kim, Korea Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 9655:
Fifth Asia-Pacific Optical Sensors Conference
Byoungho Lee; Sang-Bae Lee; Yunjiang Rao, Editor(s)

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