Share Email Print
cover

Proceedings Paper

Application of the axial intensity scan in optical testing
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Axial intensity scans provide a noninterferometric method for measuring aberration content of a focused beam. Applications of the technique include the determination of the conic constant of aspheric mirrors (without the need for a null lens).

Paper Details

Date Published: 8 September 1995
PDF: 9 pages
Proc. SPIE 2536, Optical Manufacturing and Testing, (8 September 1995); doi: 10.1117/12.218419
Show Author Affiliations
Qian Gong, Swales & Associates, Inc. (United States)
Joseph M. Geary, Swales & Associates, Inc. (United States)


Published in SPIE Proceedings Vol. 2536:
Optical Manufacturing and Testing
Victor J. Doherty; H. Philip Stahl, Editor(s)

© SPIE. Terms of Use
Back to Top