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Proceedings Paper

Testing aspheric surfaces by TWHI
Author(s): Yueqiang Lee; Yongchao Shi; Ling Du
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Paper Abstract

The usage of two-wavelength holographic interferometry (TWHI) in testing aspherics and evaluating the testing results are discussed in the paper. TWHI accomplishes actual long- wavelength interferometry, using visible light as working wavelength. The sensitivity, accuracy, and range of measurement can be adjusted conveniently.

Paper Details

Date Published: 8 September 1995
PDF: 5 pages
Proc. SPIE 2536, Optical Manufacturing and Testing, (8 September 1995); doi: 10.1117/12.218418
Show Author Affiliations
Yueqiang Lee, Beijing Institute of Mechanical Industry (China)
Yongchao Shi, Beijing Institute of Mechanical Industry (China)
Ling Du, Beijing Institute of Mechanical Industry (China)


Published in SPIE Proceedings Vol. 2536:
Optical Manufacturing and Testing
Victor J. Doherty; H. Philip Stahl, Editor(s)

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