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Proceedings Paper

Calibration and characterization of HETG grating elements at the MIT X-Ray Grating Evaluation Facility
Author(s): Kathryn A. Flanagan; Daniel Dewey; Leonard Bordzol
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Paper Abstract

The high energy transmission grating spectrometer (HETGS) of the Advanced X-Ray Astrophysics Facility (AXAF) will include 336 gratings, of period 2000 angstrom and 4000 angstrom. The flight gratings have entered production, and preliminary tests for verification and calibration have begun. We present the current status of the x-ray tests at MIT, focusing on diffraction efficiency measurements and a grating tilt test. We indicate the direction the x ray testing will take in the near term.

Paper Details

Date Published: 1 September 1995
PDF: 19 pages
Proc. SPIE 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, (1 September 1995); doi: 10.1117/12.218400
Show Author Affiliations
Kathryn A. Flanagan, Massachusetts Institute of Technology (United States)
Daniel Dewey, Massachusetts Institute of Technology (United States)
Leonard Bordzol, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 2518:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI
Oswald H. W. Siegmund; John V. Vallerga, Editor(s)

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