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Proceedings Paper

Microchannel plate testing and evaluation for the AXAF high-resolution camera (HRC)
Author(s): Almus T. Kenter; Kathryn A. Flanagan; G. R. Meehan; Stephen S. Murray; Martin V. Zombeck; George W. Fraser; James F. Pearson; John Ernest Lees; Adam N. Brunton; Sarah E. Pearce
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Paper Abstract

The high resolution camera (HRC) will be one of the two focal plane instruments on the Advanced X-ray Astrophysics Facility (AXAF). AXAF is a major NASA space observatory and is scheduled for launch in 1998. The essential elements of the HRC instruments are chevron pairs of microchannel plates (MCPs). The HRC MCPs provide x ray conversion and electron multiplication while maintaining high spatial and temporal resolution. In addition, the HRC MCPs will be the largest format, the lowest internal background, and the highest resolution of any MCP-based x-ray imaging detector. This paper presents results obtained in testing and evaluating flight candidate MCPs with emphasis on their low internal background out-of-band (high energy) response and their spatial uniformity.

Paper Details

Date Published: 1 September 1995
PDF: 19 pages
Proc. SPIE 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, (1 September 1995); doi: 10.1117/12.218389
Show Author Affiliations
Almus T. Kenter, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Kathryn A. Flanagan, Harvard-Smithsonian Ctr. for Astrophysics (United States)
G. R. Meehan, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Stephen S. Murray, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Martin V. Zombeck, Harvard-Smithsonian Ctr. for Astrophysics (United States)
George W. Fraser, Univ. of Leicester (United Kingdom)
James F. Pearson, Univ. of Leicester (United Kingdom)
John Ernest Lees, Univ. of Leicester (United Kingdom)
Adam N. Brunton, Univ. of Leicester (United Kingdom)
Sarah E. Pearce, Univ. of Leicester (United Kingdom)


Published in SPIE Proceedings Vol. 2518:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI
Oswald H. W. Siegmund; John V. Vallerga, Editor(s)

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