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Proceedings Paper

Soft x-ray (50-1800 eV) measurements of niobium superconducting tunnel junctions
Author(s): David H. Lumb; Axel van Dordrecht; Anthony J. Peacock; Nicola Rando; Peter Verhoeve; J. Verveer; D. J. Goldie; John M. Lumley
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Paper Abstract

Measurements are presented on the x ray response of superconducting tunnel junction (STJ) detectors, over the energy range of 50 - 1800 eV. This includes the measurement of the lowest x-ray energies published to date. Energy resolution and response linearity is measured as a function of device geometry. It is shown that self-recombination of quasi-particles leads to an energy non-linearity which depends on junction volume. The effect of count rate limitations on energy resolution is established for rates up to 10 kHz.

Paper Details

Date Published: 1 September 1995
PDF: 10 pages
Proc. SPIE 2518, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI, (1 September 1995); doi: 10.1117/12.218382
Show Author Affiliations
David H. Lumb, European Space Agency/ESTEC (Netherlands)
Axel van Dordrecht, European Space Agency/ESTEC (Netherlands)
Anthony J. Peacock, European Space Agency/ESTEC (Netherlands)
Nicola Rando, European Space Agency/ESTEC (Netherlands)
Peter Verhoeve, European Space Agency/ESTEC (Netherlands)
J. Verveer, European Space Agency/ESTEC (Netherlands)
D. J. Goldie, Oxford Instruments (United Kingdom)
John M. Lumley, Oxford Instruments (United Kingdom)


Published in SPIE Proceedings Vol. 2518:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VI
Oswald H. W. Siegmund; John V. Vallerga, Editor(s)

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