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Proceedings Paper

Time-resolved materials science opportunities using synchrotron x-ray sources
Author(s): Bennett C. Larson; J. Z. Tischler
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Paper Abstract

The high brightness, high intensity, and pulsed time-structure of synchrotron sources provide new opportunities for time-resolved x-ray diffraction investigations. With third generation synchrotron sources coming online, high brilliance and high brightness are now available in x- ray beams with the highest flux. In addition to the high average flux, the instantaneous flux available in synchrotron beams is greatly enhanced by the pulsed time structure, which consists of short bursts of x-rays that are separated by approximately tens to hundreds of nanoseconds. Time-resolved 1D and 2D position sensitive detection techniques that take advantage of synchrotron radiation for materials science x-ray diffraction ivestigations are presented, and time resolved materials science applications are discussed in terms of recent diffraction and spectroscopy results and materials research opportunities.

Paper Details

Date Published: 1 September 1995
PDF: 12 pages
Proc. SPIE 2521, Time-Resolved Electron and X-Ray Diffraction, (1 September 1995); doi: 10.1117/12.218353
Show Author Affiliations
Bennett C. Larson, Oak Ridge National Lab. (United States)
J. Z. Tischler, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 2521:
Time-Resolved Electron and X-Ray Diffraction
Peter M. Rentzepis, Editor(s)

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