Share Email Print
cover

Proceedings Paper

Roughness measurement of dielectrics with light scatter
Author(s): Marvin L. Bernt; John C. Stover
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The literature now includes a number of examples where light scatter (BRDF) measurements have been used to determine the surface power spectral density function of smooth, clean reflectors. But most of this data is for front surface metal mirrors and semiconductors. Black glass has been considered for use as a BRDF standard, and there are industry applications (computer disks and front panel displays) that could benefit from the same type of characterization from glass and ceramic surfaces. This paper addresses some of the issues involved with making surface roughness measurements on these surfaces. For example, clear glass will scatter a visible beam from its bulk and second surface as well as its front surface. In addition, calculation of the polarization constant Q must be handled in a more accurate manner. Data from several samples will be analyzed.

Paper Details

Date Published: 1 September 1995
PDF: 9 pages
Proc. SPIE 2541, Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries, (1 September 1995); doi: 10.1117/12.218338
Show Author Affiliations
Marvin L. Bernt, Schmitt Measurement Systems (United States)
John C. Stover, The Scatter Works, Inc. (United States)


Published in SPIE Proceedings Vol. 2541:
Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries
John C. Stover, Editor(s)

© SPIE. Terms of Use
Back to Top