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Proceedings Paper

Instrumentation for the determination of material properties from spectroscopic measurements of total integrated scatter
Author(s): G. Lewis Powell; T. E. Barber; John Ternay Neu
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Paper Abstract

A variety of important optical properties can be determined from spectroscopic analysis of diffuse reflectance of surfaces. The design of a small user friendly, lightweight, field hardened, computer controlled device for performing infrared spectroscopic analysis of trace contaminants on surfaces is described. The device employs a miniature Fourier transform infrared spectrometer with very efficient diffuse reflectance optics and a portable computer to provide reflectance spectra of surfaces measured relative to some idealized surface. These spectra yield qualitative and quantitative chemical information from a host of surfaces that has imminently practical applications in the determination of surface identification, contamination, and degradation.

Paper Details

Date Published: 1 September 1995
PDF: 12 pages
Proc. SPIE 2541, Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries, (1 September 1995); doi: 10.1117/12.218330
Show Author Affiliations
G. Lewis Powell, Oak Ridge Ctrs. for Manufacturing Technologies (United States)
T. E. Barber, Oak Ridge Ctrs. for Manufacturing Technologies (United States)
John Ternay Neu, Surface Optics Corp. (United States)


Published in SPIE Proceedings Vol. 2541:
Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries
John C. Stover, Editor(s)

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