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Proceedings Paper • Open Access

Introduction to special session on microscopy for Science, Technology, Engineering and Math (STEM) educators
Author(s): Michael T. Postek; Mary Satterfield; Bradley Damazo; Robert Gordon

Paper Abstract

The future of our nation hinges on our ability to prepare our next generation to be innovators in science, technology, engineering and math (STEM). Excitement for STEM must begin at the earliest stages of our education process. Yet, today far too few of our students are prepared for the challenges ahead. Several initiatives are trying to change this situation. “Microscopy for STEM Educators” was an initiative that demonstrated the value of incorporating microscopy into STEM education. Several notable invited speakers discussed their successful programs implementing microscopy in STEM education in order to foster student interest and excitement. A hands-on session with table-top scanning electron microscopes was held at the end of the presentations and the attendees were encouraged to bring samples of interest and operate the instruments. This paper outlines some of the accomplishments and goals of this session.

Paper Details

Date Published: 2 December 2014
PDF: 6 pages
Proc. SPIE 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 837817 (2 December 2014); doi: 10.1117/12.2183085
Show Author Affiliations
Michael T. Postek, National Institute of Standards and Technology (United States)
Mary Satterfield, National Institute of Standards and Technology (United States)
Bradley Damazo, National Institute of Standards and Technology (United States)
Robert Gordon, Hitachi High Technologies America, Inc. (United States)


Published in SPIE Proceedings Vol. 8378:
Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Tim K. Maugel, Editor(s)

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