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Proceedings Paper

Principal component analysis based carrier removal approach for Fourier transform profilometry
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Paper Abstract

To handle the issue of the nonlinear carrier phase due to the divergent illumination commonly adopted in the fringe projection measurement, we propose a principal component analysis (PCA) based carrier removal method for Fourier transform profilometry. By PCA, the method can decompose the nonlinear carrier phase map into several principal components, where the phase of the carrier can be extracted from the first dominant component acquired. It is effective and requires less human intervention since no data points need to be collected from the reference plane in advance compared with traditional methods. Further, the influence of the lens distortion is considered thus the carrier can be determined more accurately. Our experiment shows the validity of the proposed approach.

Paper Details

Date Published: 22 June 2015
PDF: 5 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95252E (22 June 2015); doi: 10.1117/12.2182953
Show Author Affiliations
Shijie Feng, Nanjing Univ. of Science and Technology (China)
Qian Chen, Nanjing Univ. of Science and Technology (China)
Chao Zuo, Nanjing Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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