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Proceedings Paper

Point-based deflectometry for measuring optical freeform topographies
Author(s): Carsten Glasenapp
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Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95251A; doi: 10.1117/12.2182754
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Carsten Glasenapp, Carl Zeiss AG (Germany)


Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves, Editor(s)

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