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Proceedings Paper

Problems and prospects of laboratory reflectometry in soft X-ray and EUV ranges
Author(s): Nikolai Chkhalo; Nikolay N. Salashchenko; Alexander Scherbakov; Sergei Yu. Zuev
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Proc. SPIE 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV, 95100R; doi: 10.1117/12.2182404
Show Author Affiliations
Nikolai Chkhalo, Institute for Physics of Microstructures (Russian Federation)
Nikolay N. Salashchenko, Institute for Physics of Microstructures (Russian Federation)
Alexander Scherbakov, Institute for Physics of Microstructures (Russian Federation)
Sergei Yu. Zuev, Institute for Physics of Microstructures (Russian Federation)


Published in SPIE Proceedings Vol. 9510:
EUV and X-ray Optics: Synergy between Laboratory and Space IV
René Hudec; Ladislav Pina, Editor(s)

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