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Proceedings Paper

Construction status of CXI beamline at PAL-XFEL
Author(s): Jaehyun Park; Ki-Hyun Nam; Sangsoo Kim; Bongsoo Kim; In Soo Ko; Moohyun Cho
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Paper Abstract

Pohang Accelerator Laboratory X-ray Free Electron Laser (PAL-XFEL) is a research facility currently under construction. It will provide ultra-bright (assuming 1 X 1012 photons/pulse at 12.4 keV) and ultra-short (10-60 femtosecond) X-ray pulses. The CXI (Coherent X-ray Imaging) end-station, which will be constructed for hard X-ray beamline at the PAL-XFEL, is designed to deliver brilliant hard x-rays (2-20 keV) and to measure diffraction signals with forward scattering geometry, mainly. Not only will it offer imaging studies of biological, chemical and physical samples by the “diffract-before-destroy” technique, but will also be helpful in high field hard x-ray physics and material science. The scientific programs are currently aimed at serial femtosecond crystallography (SFX) for macromolecular systems and coherent diffraction imaging for bio specimens and nano structures etc. In this paper, we describe the details of the beamline layout, X-ray focusing optics (Kirkpatrick-Baez mirror and Beryllium CRLs) and sample delivery system (liquid jet/LCP sample injector, fixed target system) that will be installed at the CXI beamline.

Paper Details

Date Published: 12 May 2015
PDF: 7 pages
Proc. SPIE 9512, Advances in X-ray Free-Electron Lasers Instrumentation III, 95121U (12 May 2015); doi: 10.1117/12.2182364
Show Author Affiliations
Jaehyun Park, Pohang Univ. of Science and Technology (Korea, Republic of)
Ki-Hyun Nam, Pohang Univ. of Science and Technology (Korea, Republic of)
Sangsoo Kim, Pohang Univ. of Science and Technology (Korea, Republic of)
Bongsoo Kim, Pohang Univ. of Science and Technology (Korea, Republic of)
In Soo Ko, Pohang Univ. of Science and Technology (Korea, Republic of)
Moohyun Cho, Pohang Univ. of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 9512:
Advances in X-ray Free-Electron Lasers Instrumentation III
Sandra G. Biedron, Editor(s)

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