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Proceedings Paper

Absolute distance measurement using frequency-comb-referenced four-wavelength interferometry
Author(s): Guochao Wang; Yoon-Soo Jang; Hyunjay Kang; Byung Jae Chun; Young-Jin Kim; Seung-Woo Kim
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Paper Abstract

We measure absolute distances by performing multi-wavelength interferometry (MWI) using four different wavelengths generated simultaneously from the frequency comb of a femtosecond laser. The measurement precision is estimated to be less than 63 nm in peak-to-valley over a distance of 1 m as compared to an incremental HeNe laser interferometer. We also evaluate the operational stability and robustness of the interferometer hardware system over a time period of 12 hours. Finally, it is concluded that the proposed frequency-comb-referenced multi-wavelength interferometry is capable of providing fast, precise and high stable absolute distance measurements, being well suited for industrial precisionengineering applications and near-future space missions.

Paper Details

Date Published: 6 March 2015
PDF: 7 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94464N (6 March 2015); doi: 10.1117/12.2182140
Show Author Affiliations
Guochao Wang, KAIST (Korea, Republic of)
National Univ. of Defense Technology (China)
Yoon-Soo Jang, KAIST (Korea, Republic of)
Hyunjay Kang, KAIST (Korea, Republic of)
Byung Jae Chun, KAIST (Korea, Republic of)
Young-Jin Kim, KAIST (Korea, Republic of)
Seung-Woo Kim, KAIST (Korea, Republic of)


Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)

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