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Proceedings Paper

Linear optical constants of ultrathin copperphthalocyanine films from transmittance and reflectance data: error function minimization when the film thickness is below 20 nm
Author(s): Olaf Stenzel; Ralf Petrich; Steffen Wilbrandt; Ulf Beckers; Alexander Stendal; Kersten Voigtsberger; Christian von Borczyskowski
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Paper Abstract

Thin copperphthalocyanine layers have been deposited on quartz glass substrates and investigated by means of transmission and reflection spectroscopy. The film thickness ranged between 20 nm and the subnanometer region. The determination of the optical constants allowed the estimation of the oscillator strengths for the relevant molecular transitions. A thickness dependence of the Q-band absorption maximum position could be established for layers with a thickness below 5 nm. The contributions of several physical mechanisms to such lineshifts are discussed.

Paper Details

Date Published: 1 September 1995
PDF: 9 pages
Proc. SPIE 2554, Growth and Characterization of Materials for Infrared Detectors II, (1 September 1995); doi: 10.1117/12.218200
Show Author Affiliations
Olaf Stenzel, Chemnitz-Zwickau Univ. of Technology (Germany)
Ralf Petrich, Chemnitz-Zwickau Univ. of Technology (Germany)
Steffen Wilbrandt, Chemnitz-Zwickau Univ. of Technology (Germany)
Ulf Beckers, Chemnitz-Zwickau Univ. of Technology (Germany)
Alexander Stendal, Chemnitz-Zwickau Univ. of Technology (Germany)
Kersten Voigtsberger, Chemnitz-Zwickau Univ. of Technology (Germany)
Christian von Borczyskowski, Chemnitz-Zwickau Univ. of Technology (Germany)


Published in SPIE Proceedings Vol. 2554:
Growth and Characterization of Materials for Infrared Detectors II
Randolph E. Longshore; Jan W. Baars; Avishai Kepten; John M. Trombetta, Editor(s)

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