Share Email Print
cover

Proceedings Paper

Determination of the composition of a complex semiconductor compound from its thermal emission spectrum
Author(s): Victor A. Botte
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The possibility of use of the thermal emission of a complex semiconductor compound for determination of its forbidden band gap and, hence, the composition is examined. Measurements were carried out on p-type Hg1-xCdxTe films with 0.197 <EQ X <EQ 0.233 at room temperature.

Paper Details

Date Published: 1 September 1995
PDF: 3 pages
Proc. SPIE 2554, Growth and Characterization of Materials for Infrared Detectors II, (1 September 1995); doi: 10.1117/12.218199
Show Author Affiliations
Victor A. Botte, Institute of Semiconductor Physics (Ukraine)


Published in SPIE Proceedings Vol. 2554:
Growth and Characterization of Materials for Infrared Detectors II
Randolph E. Longshore; Jan W. Baars; Avishai Kepten; John M. Trombetta, Editor(s)

© SPIE. Terms of Use
Back to Top