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Proceedings Paper

Nondestructive characterization of Ti-doped and V-doped CdTe by time-dependent charge measurement
Author(s): Clemens Eiche; Ralf Schwarz; Wolfgang Joerger; Michael Fiederle; Dirk G. Ebling; Klaus-Werner Benz
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Paper Abstract

As a nondestructive, contactless characterization method time dependent charge measurements (TDCM) are used for the investigation of high resistivity CdTe doped with vanadium or titanium. TDCM is presented as a multi-purpose technique which allows for the examination of the resistivity, the thermal activation energy of the charge carriers, the photosensitivity and the surface voltage (SPV). Strong axial variations of the physical properties are observed as a consequence of the segregation of the dopants.

Paper Details

Date Published: 1 September 1995
PDF: 4 pages
Proc. SPIE 2554, Growth and Characterization of Materials for Infrared Detectors II, (1 September 1995); doi: 10.1117/12.218197
Show Author Affiliations
Clemens Eiche, Univ. of Freiburg (Germany)
Ralf Schwarz, Univ. of Freiburg (Germany)
Wolfgang Joerger, Univ. of Freiburg (Germany)
Michael Fiederle, Univ. of Freiburg (Germany)
Dirk G. Ebling, Univ. of Freiburg (Germany)
Klaus-Werner Benz, Univ. of Freiburg (Germany)


Published in SPIE Proceedings Vol. 2554:
Growth and Characterization of Materials for Infrared Detectors II
Randolph E. Longshore; Jan W. Baars; Avishai Kepten; John M. Trombetta, Editor(s)

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