Share Email Print
cover

Proceedings Paper

Feature extraction of probe mark image and automatic detection of probing pad defects in semiconductor using CSVM
Author(s): Jeong-Hoon Lee; Jee-Hyong Lee
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As semiconductor micro-fabrication process continues to advance, the size of probing pads also become smaller in a chip. A probe needle contacts each probing pad for electrical test. However, probe needle may incorrectly touch probing pad. Such contact failures damage probing pads and cause qualification problems. In order to detect contact failures, the current system observes the probing marks on pads. Due to a low accuracy of the system, engineers have to redundantly verify the result of the system once more, which causes low efficiency. We suggest an approach for automatic defect detection to solve these problems using image processing and CSVM. We develop significant features of probing marks to classify contact failures more correctly. We reduce 38% of the workload of engineers.

Paper Details

Date Published: 14 February 2015
PDF: 6 pages
Proc. SPIE 9445, Seventh International Conference on Machine Vision (ICMV 2014), 94450H (14 February 2015); doi: 10.1117/12.2181518
Show Author Affiliations
Jeong-Hoon Lee, Samsung Electronics (Korea, Republic of)
Sungkunkwan Univ. (Korea, Republic of)
Jee-Hyong Lee, Sungkunkwan Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 9445:
Seventh International Conference on Machine Vision (ICMV 2014)
Antanas Verikas; Branislav Vuksanovic; Petia Radeva; Jianhong Zhou, Editor(s)

© SPIE. Terms of Use
Back to Top