Share Email Print
cover

Proceedings Paper

Reflective off-axis point-diffraction interferometer based on Michelson architecture
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A reflective off-axis point-diffraction interferometer based on Michelson architecture is built to measure static and dynamic quantitative phase in a single shot. The interferometer is constructed by a beam-splitter, a pinhole mirror, a reflective mirror and two lenses to build a 4f optical system. The pinhole mirror is used as a low-pass spatial filter to generate reference wave. By tilting the reflective mirror, a small angle is created between the object beam and the reference beam to enable an off-axis interferogram. To reconstruct an interferogram with a few fringes, Kreis Fourier method is used to recovery the specimen phase. Using a plano-convex cylinder lens and an evaporative alcohol drop as the specimens, experiments are run to verify the effectiveness and robustness with this interferometer. Experimental results show that this interferometer has not only simple setup and good anti-interference performance, but also good real-time ability, which makes it suitable for dynamic phase measurement.

Paper Details

Date Published: 6 March 2015
PDF: 5 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94460T (6 March 2015); doi: 10.1117/12.2180665
Show Author Affiliations
Hongyi Bai, Harbin Engineering Univ. (China)
Lili Guo, Harbin Engineering Univ. (China)
Zhi Zhong, Harbin Engineering Univ. (China)
Mingguang Shan, Harbin Engineering Univ. (China)
Yabin Zhang, Harbin Engineering Univ. (China)


Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top