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Proceedings Paper

Discussion of beam quality of semiconductor lasers
Author(s): Chang-Qing Cao; Xiao-Dong Zeng; Xiang Wang; Zhi Lai; Long Luo
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Paper Abstract

Based on the beam characteristics of semiconductor lasers, a new parameter for evaluating beam quality of semiconductor lasers is introduced. The shortcomings of M2 factor used in evaluating beam quality of semiconductor lasers are discussed and its limitations are pointed out. Moreover, some important aspects of the beam quality factor are discussed. The main factors to influence collimating the beam of semiconductor lasers are analyzed. Our results give us grounds to make the following conclusions: the new propagation parameter succeeds in its universality and adaptability.

Paper Details

Date Published: 13 April 2015
PDF: 4 pages
Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95221W (13 April 2015); doi: 10.1117/12.2180240
Show Author Affiliations
Chang-Qing Cao, Xidian Univ. (China)
Xiao-Dong Zeng, Xidian Univ. (China)
Xiang Wang, Xidian Univ. (China)
Zhi Lai, Xidian Univ. (China)
Long Luo, Xidian Univ. (China)


Published in SPIE Proceedings Vol. 9522:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II
Xiangwan Du; Jennifer Liu; Dianyuan Fan; Jialing Le; Yueguang Lv; Jianquan Yao; Weimin Bao; Lijun Wang, Editor(s)

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