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Proceedings Paper

Temperature sensor and display researched based on micro-deformation of beam splitting mirror in holographic system
Author(s): Delong Yang; Xiuyan Chen; Peng Gao; Ji Yu; Xue Sun; Xin Wang
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Paper Abstract

The 45° beam splitting mirror plays a vital role on image quality in the Holographic system, in order to study the influence of environment temperature variation on the 45° beam splitting mirror in the Holographic system, finite element analysis method is used to simulate the anti-three through seven mirror deformation at 27℃, 28℃ and 29℃ temperature in theory. A new real-time monitoring and displaying photoelectric system for ambient temperature and beam splitting mirror distortion detection is designed to provide real-time temperature change and deformation detection , which is made up of laser speckle interferometer, chip temperature sensor, two-operational amplifier, MCU and LED indicator. And the out-plane displacement value measured in the experiment under the condition of temperature correspondingly are 406nm, 420nm and 427 nm. Finally, the relation equation of temperature and mirror deformation is established by the method of exponential equation fitting, which will provide preliminary theoretical and experimental reference for further research.

Paper Details

Date Published: 13 April 2015
PDF: 7 pages
Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95221J (13 April 2015); doi: 10.1117/12.2180057
Show Author Affiliations
Delong Yang, Shenyang Normal Univ. (China)
Xiuyan Chen, Shenyang Normal Univ. (China)
Shanghai Institute of Optics and Fine Mechanics (China)
Peng Gao, Shenyang Normal Univ. (China)
Ji Yu, Shenyang Normal Univ. (China)
Xue Sun, Shenyang Normal Univ. (China)
Xin Wang, Shenyang Normal Univ. (China)


Published in SPIE Proceedings Vol. 9522:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II
Xiangwan Du; Jennifer Liu; Dianyuan Fan; Jialing Le; Yueguang Lv; Jianquan Yao; Weimin Bao; Lijun Wang, Editor(s)

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