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Proceedings Paper

InGaAs focal plane array developments and perspectives
Author(s): A. Rouvié; J. Coussement; O. Huet; J P. Truffer; M. Pozzi; E. H. Oubensaid; S. Hamard; V. Chaffraix; E. Costard
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Paper Abstract

SWIR spectral band is an attractive domain thanks to its intrinsic properties. Close to visible wavelengths, SWIR images interpretation is made easier for field actors. Besides complementary information can be extracted from SWIR band and bring significant added value in several fields of applications such as defense and security (night vision, active imaging), space (earth observation), transport (automotive safety) or industry (non destructive process control).

Among the various new technologies able to detect SWIR wavelengths, InGaAs appears as a key technology. Initially developed for optical telecommunications, this material guaranties performances, stability and reliability and is compatible with attractive production capacity. Thanks to high quality material, very low dark current levels can be achieved at ambient temperature. Then uncooled operation can be set up, allowing compact and low power systems.

Since the recent transfer of InGaAs imaging activities from III-Vlab, Sofradir provides a framework for the production activity with the manufacturing of high performances products: CACTUS320 SW. The developments towards VGA format with 15μm pixel pitch, lead today to the industrialization of a new product: SNAKE. On one side, the InGaAs detection array presents high performances in terms of dark current and quantum efficiency. On the other side, the low noise ROIC has different additional functionalities. Then this 640x512 @ 15μm sensor appears as well suited to answer the needs of a wide range of applications.

In this paper, we will present the Sofradir InGaAs technology, the performances of our last product SNAKE and the perspectives of InGaAs new developments.

Paper Details

Date Published: 26 May 2015
PDF: 8 pages
Proc. SPIE 9451, Infrared Technology and Applications XLI, 945105 (26 May 2015); doi: 10.1117/12.2179986
Show Author Affiliations
A. Rouvié, SOFRADIR (France)
J. Coussement, SOFRADIR (France)
O. Huet, SOFRADIR (France)
J P. Truffer, SOFRADIR (France)
M. Pozzi, SOFRADIR (France)
E. H. Oubensaid, SOFRADIR (France)
S. Hamard, SOFRADIR (France)
V. Chaffraix, SOFRADIR (France)
E. Costard, SOFRADIR (France)


Published in SPIE Proceedings Vol. 9451:
Infrared Technology and Applications XLI
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton, Editor(s)

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