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Proceedings Paper

Noise analysis for high speed CMOS image sensor
Author(s): Zhi-qiang Guo; Li-yuan Liu; Jian Liu; Nan-jian Wu
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Paper Abstract

Noise performance of the high speed image sensor is a bottle neck for its low illumination applications. As the foremost stage circuit, pixel noise is an important portion of high speed image sensor system. This paper has discussed and analyzed the different noise source of the 4T pixel and influence on the image quality of high speed image sensor in detail. We proposed circuit model of pixel with ideal correlated double sampler to simulate the noise source distribution in the pixel and noise reducing methods. Pixel random readout noise can be effectively reduced to 5.44e by optimizing the gate size of the reset transistor.

Paper Details

Date Published: 13 April 2015
PDF: 6 pages
Proc. SPIE 9522, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II, 95220V (13 April 2015); doi: 10.1117/12.2179448
Show Author Affiliations
Zhi-qiang Guo, Institute of Semiconductors (China)
Li-yuan Liu, Institute of Semiconductors (China)
Jian Liu, Institute of Semiconductors (China)
Nan-jian Wu, Institute of Semiconductors (China)


Published in SPIE Proceedings Vol. 9522:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part II
Xiangwan Du; Jennifer Liu; Dianyuan Fan; Jialing Le; Yueguang Lv; Jianquan Yao; Weimin Bao; Lijun Wang, Editor(s)

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