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Proceedings Paper

Enhanced modeling and simulation of EO/IR sensor systems
Author(s): Jonathan G. Hixson; Brian Miller; Christopher May
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Paper Abstract

The testing and evaluation process developed by the Night Vision and Electronic Sensors Directorate (NVESD) Modeling and Simulation Division (MSD) provides end to end systems evaluation, testing, and training of EO/IR sensors. By combining NV-LabCap, the Night Vision Integrated Performance Model (NV-IPM), One Semi-Automated Forces (OneSAF) input sensor file generation, and the Night Vision Image Generator (NVIG) capabilities, NVESD provides confidence to the M&S community that EO/IR sensor developmental and operational testing and evaluation are accurately represented throughout the lifecycle of an EO/IR system. This new process allows for both theoretical and actual sensor testing. A sensor can be theoretically designed in NV-IPM, modeled in NV-IPM, and then seamlessly input into the wargames for operational analysis. After theoretical design, prototype sensors can be measured by using NV-LabCap, then modeled in NV-IPM and input into wargames for further evaluation. The measurement process to high fidelity modeling and simulation can then be repeated again and again throughout the entire life cycle of an EO/IR sensor as needed, to include LRIP, full rate production, and even after Depot Level Maintenance. This is a prototypical example of how an engineering level model and higher level simulations can share models to mutual benefit.

Paper Details

Date Published: 22 May 2015
PDF: 8 pages
Proc. SPIE 9478, Modeling and Simulation for Defense Systems and Applications X, 947807 (22 May 2015); doi: 10.1117/12.2179374
Show Author Affiliations
Jonathan G. Hixson, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Brian Miller, U.S. Army Night Vision & Electronic Sensors Directorate (United States)
Christopher May, U.S. Army Night Vision & Electronic Sensors Directorate (United States)


Published in SPIE Proceedings Vol. 9478:
Modeling and Simulation for Defense Systems and Applications X
Eric J. Kelmelis, Editor(s)

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