Share Email Print
cover

Proceedings Paper

A 2D nanoparticle sorter: towards an on-chip quantification and full characterization of nanoparticles
Author(s): Cloé Desmet; Andrea Valsesia; Pascal Colpo; François Rossi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In the context of the extensive use of engineered nanomaterials (ENMs) in consumer products, industrial applications and nanomedicine, there is an important need of new methods for an exhaustive characterization of their physicochemical properties. Among them, surface hydrophobicity is considered as a key factor to be controlled, in particular for nanomedicine applications1,2. The proposed study demonstrates the proof-of-concept of an inexpensive characterization process, enabling the sorting of ENMs according to their hydrophobicity and surface charge, together with the classical characterization of size and shape. The detection platform is based on the use of a surface modified through plasma polymer and layer-by-layer polyelectrolyte deposition in order to generate areas of tuned surface properties to bind ENMs selectively by hydrophobic forces and electrostatic interactions. The key advantages of such a device is the decrease of time and assay costs thanks to the all-in-one characterization process and the multiplexing that could replace the use of different methods and expensive equipment to give equivalent results. In this way, the full characterization of NP could be expanded in all the areas covering NP-related applications.

Paper Details

Date Published: 1 June 2015
PDF: 9 pages
Proc. SPIE 9519, Nanotechnology VII, 95190M (1 June 2015); doi: 10.1117/12.2178839
Show Author Affiliations
Cloé Desmet, Institute for Health and Consumer Protection (Italy)
Andrea Valsesia, Institute for Health and Consumer Protection (Italy)
Pascal Colpo, Institute for Health and Consumer Protection (Italy)
François Rossi, Institute for Health and Consumer Protection (Italy)


Published in SPIE Proceedings Vol. 9519:
Nanotechnology VII
Ion M. Tiginyanu, Editor(s)

© SPIE. Terms of Use
Back to Top