Share Email Print
cover

Proceedings Paper

A compact semiconductor digital interferometer and its applications
Author(s): Oleksander I. Britsky; Ivan V. Gorbov; Viacheslav V. Petrov; Iryna V. Balagura
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The possibility of using semiconductor laser interferometers to measure displacements at the nanometer scale was demonstrated. The creation principles of miniature digital Michelson interferometers based on semiconductor lasers were proposed. The advanced processing algorithm for the interferometer quadrature signals was designed. It enabled to reduce restrictions on speed of measured movements. A miniature semiconductor digital Michelson interferometer was developed. Designing of the precision temperature stability system for miniature low-cost semiconductor laser with 0.01ºС accuracy enabled to use it for creation of compact interferometer rather than a helium-neon one. Proper firmware and software was designed for the interferometer signals real-time processing and conversion in to respective shifts. In the result the relative displacement between 0-500 mm was measured with a resolution of better than 1 nm. Advantages and disadvantages of practical use of the compact semiconductor digital interferometer in seismometers for the measurement of shifts were shown.

Paper Details

Date Published: 5 May 2015
PDF: 7 pages
Proc. SPIE 9506, Optical Sensors 2015, 95060G (5 May 2015); doi: 10.1117/12.2178476
Show Author Affiliations
Oleksander I. Britsky, Institute for Information Recording (Ukraine)
Ivan V. Gorbov, Institute for Information Recording (Ukraine)
Viacheslav V. Petrov, Institute for Information Recording (Ukraine)
Iryna V. Balagura, Institute for Information Recording (Ukraine)


Published in SPIE Proceedings Vol. 9506:
Optical Sensors 2015
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

© SPIE. Terms of Use
Back to Top