Share Email Print
cover

Proceedings Paper

TiO2/SiO2 dielectric film damage induced by combination of pulsed and continuous wave infrared laser irradiation
Author(s): Menglian Zhou; Yue Cai; Minbo He; Lijun Wang; Chenghua Wei
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper describes the combined irradiation effect of 2.7μm pulsed and 10.6μm continuous wave (CW) lasers on TiO2/SiO2 dielectric films. There were four combined irradiation time sequences, two of which were irradiation one after another and two were irradiation overlap. Single laser irradiation on the films was also carried out for analyzing the different results. The transmission spectrums of the films in visible and NIR region were measured before and after laser irradiation, which was taken as one of the measures of the damage degree. Typical damage morphologies under different conditions and the standing electromagnetic wave field of two laser wavelengths in the film samples were given. Comparing the irradiation results of different time sequences, especially when the pulsed laser ahead or behind of CW laser, conclusion can be drawn that the overlap of pulsed and CW laser had the most serious damage degree of the films.

Paper Details

Date Published: 4 May 2015
PDF: 6 pages
Proc. SPIE 9543, Third International Symposium on Laser Interaction with Matter, 954306 (4 May 2015); doi: 10.1117/12.2178230
Show Author Affiliations
Menglian Zhou, Northwest Institute of Nuclear Technology (China)
Yue Cai, Northwest Institute of Nuclear Technology (China)
Minbo He, Northwest Institute of Nuclear Technology (China)
Lijun Wang, Northwest Institute of Nuclear Technology (China)
Chenghua Wei, Northwest Institute of Nuclear Technology (China)


Published in SPIE Proceedings Vol. 9543:
Third International Symposium on Laser Interaction with Matter
Yury M. Andreev; Zunqi Lin; Xiaowu Ni; Xisheng Ye, Editor(s)

© SPIE. Terms of Use
Back to Top