Share Email Print
cover

Proceedings Paper

System response function: a new approach to minimize IR testing errors
Author(s): Stephen W. McHugh; Dave A. Gallinger; Eden Y.C. Mei
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Thermal Imaging Systems are characterized by various tests such as Minimum Resolvable Temperature (MRT), System Intensity Transfer Function (SITF) and Noise Equivalent Temperature Differential (NETD). Numerous sources of errors can effect these test giving misleading results. These error sources are analyzed and a new correction methodology is presented.

Paper Details

Date Published: 1 October 1990
PDF: 8 pages
Proc. SPIE 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing, (1 October 1990); doi: 10.1117/12.21781
Show Author Affiliations
Stephen W. McHugh, Santa Barbara Infrared, Inc. (United States)
Dave A. Gallinger, McDonnell Douglas Space System (United States)
Eden Y.C. Mei, Northrop Corp. (United States)


Published in SPIE Proceedings Vol. 1309:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing

© SPIE. Terms of Use
Back to Top