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Proceedings Paper

Cryogenic measurements of a digital pixel readout integrated circuit for LWIR
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Paper Abstract

This paper presents and discusses the cryogenic temperature (77K) measurement results of a digital readout integrated circuit (DROIC) for a 32x32 long wavelength infrared pixel sensor array designed in 90nm CMOS process. The chip achieves a signal-to-noise ratio (SNR) of 58dB with a charge handling capacity of 2.03Ge- at cryogenic temperature with 1.3mW of power dissipation. The performance of the readout is discussed in terms of power dissipation, charge handling capacity and SNR considering the fact that the process library models are not optimized for cryogenic temperature operation of the Metal-Oxide-Semiconductor (MOS) devices. These results provide an insight to foresee the design confrontations due to non-optimized device models for cryogenic temperatures particularly for short channel devices

Paper Details

Date Published: 4 June 2015
PDF: 6 pages
Proc. SPIE 9451, Infrared Technology and Applications XLI, 94510X (4 June 2015); doi: 10.1117/12.2177550
Show Author Affiliations
Atia Shafique, Sabanci Univ. (Turkey)
Melik Yazici, Sabanci Univ. (Turkey)
Huseyin Kayahan, Sabanci Univ. (Turkey)
Omer Ceylan, Sabanci Univ. (Turkey)
Yasar Gurbuz, Sabanci Univ. (Turkey)


Published in SPIE Proceedings Vol. 9451:
Infrared Technology and Applications XLI
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton, Editor(s)

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