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Proceedings Paper

Advanced E-O test capability for Army Next-Generation Automated Test System (NGATS)
Author(s): Steve Errea; J. Grigor; D. F. King; Gregory P. Matis; Steve W. McHugh; James McKechnie; Brian Nehring
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Paper Abstract

The Future E-O (FEO) program was established to develop a flexible, modular, automated test capability as part of the Next Generation Automatic Test System (NGATS) program to support the test and diagnostic needs of currently fielded U.S. Army electro-optical (E-O) devices, as well as being expandable to address the requirements of future Navy, Marine Corps and Air Force E-O systems. Santa Barbara infrared (SBIR) has designed, fabricated, and delivered three (3) prototype FEO for engineering and logistics evaluation prior to anticipated full-scale production beginning in 2016. In addition to presenting a detailed overview of the FEO system hardware design, features and testing capabilities, the integration of SBIR’s EO-IR sensor and laser test software package, IRWindows 4™, into FEO to automate the test execution, data collection and analysis, archiving and reporting of results is also described.

Paper Details

Date Published: 12 May 2015
PDF: 10 pages
Proc. SPIE 9452, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI, 945205 (12 May 2015); doi: 10.1117/12.2177454
Show Author Affiliations
Steve Errea, Santa Barbara Infrared, Inc. (United States)
J. Grigor, Santa Barbara Infrared, Inc. (United States)
D. F. King, Santa Barbara Infrared, Inc. (United States)
Gregory P. Matis, Santa Barbara Infrared, Inc. (United States)
Steve W. McHugh, Santa Barbara Infrared, Inc. (United States)
James McKechnie, Santa Barbara Infrared, Inc. (United States)
Brian Nehring, Santa Barbara Infrared, Inc. (United States)


Published in SPIE Proceedings Vol. 9452:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI
Gerald C. Holst; Keith A. Krapels, Editor(s)

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