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Proceedings Paper

Spatial frequency performance of SPRITE detectors
Author(s): Glenn D. Boreman; Allen E. Plogstedt
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Paper Abstract

Signal processing in the element (SPRITE) detectors are analyzed in terms of their main spatial-frequency-dependent parameters of modulation transfer function (MTF) and a number of equivalent elements. It is found that MTF depends on the length of the SPRITE element. The enhancement of signal-to-noise ratio also depends upon the element length and can be expressed in terms of a number of equivalent elements.

Paper Details

Date Published: 1 October 1990
PDF: 9 pages
Proc. SPIE 1309, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing, (1 October 1990); doi: 10.1117/12.21768
Show Author Affiliations
Glenn D. Boreman, CREOL/Univ. of Central Florida (United States)
Allen E. Plogstedt, McDonnell Douglas Astronautics (United States)


Published in SPIE Proceedings Vol. 1309:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing

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