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Proceedings Paper

A gallery approach for off-angle iris recognition
Author(s): Mahmut Karakaya; Rashiduddin Yoldash; Christopher Boehnen
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Paper Abstract

It has been proven that hamming distance score between frontal and off-angle iris images of same eye differs in iris recognition system. The distinction of hamming distance score is caused by many factors such as image acquisition angle, occlusion, pupil dilation, and limbus effect. In this paper, we first study the effect of the angle variations between iris plane and the image acquisition systems. We present how hamming distance changes for different off-angle iris images even if they are coming from the same iris. We observe that increment in acquisition angle of compared iris images causes the increment in hamming distance. Second, we propose a new technique in off-angle iris recognition system that includes creating a gallery of different off-angle iris images (such as, 0, 10, 20, 30, 40, and 50 degrees) and comparing each probe image with these gallery images. We will show the accuracy of the gallery approach for off-angle iris recognition.

Paper Details

Date Published: 15 May 2015
PDF: 8 pages
Proc. SPIE 9457, Biometric and Surveillance Technology for Human and Activity Identification XII, 945708 (15 May 2015); doi: 10.1117/12.2176731
Show Author Affiliations
Mahmut Karakaya, Meliksah Univ. (Turkey)
Rashiduddin Yoldash, Meliksah Univ. (Turkey)
Christopher Boehnen, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 9457:
Biometric and Surveillance Technology for Human and Activity Identification XII
Ioannis A. Kakadiaris; Ajay Kumar; Walter J. Scheirer, Editor(s)

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