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Proceedings Paper

Methods of both destructive and non-destructive metrology of GRIN optical elements
Author(s): G. P. Lindberg; J. Deegan; R. Benson; A. J Berger; J. J Linden; D. Gibson; S. Bayya; J. Sanghera; V. Nguyen; M. Kotov
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Paper Abstract

Gradient index (GRIN) optics have been an up-and-coming tool in the world of optics. By combining an index gradient with a surface curvature the number of optical components for a lens system can often be greatly reduced. Their use in the realm of infra-red is only becoming realized as new efforts are being developed to create materials that are suitable and mutually compatible for these optical components. The materials being pursued are the chalcogenide based glasses. Small changes in elemental concentrations in these glasses can have significant effects on physical and optical properties. The commonality between these glasses and their widely different optical properties make them prime candidates for GRIN applications. Traditional methods of metrology are complicated by the combination of the GRIN and the curvature of the element. We will present preliminary data on both destructive and non-destructive means of measuring the GRIN profile. Non-destructive methods may require inference of index through material properties, by careful measurement of the individual materials going into the GRIN optic, followed by, mapping measurements of the GRIN surface. Methods to be pursued are micro Raman mapping and CT scanning. By knowing the properties of the layers and accurately mapping the interfaces between the layers we should be able to back out the index profile of the GRIN optic and then confirm the profile by destructive means.

Paper Details

Date Published: 26 May 2015
PDF: 6 pages
Proc. SPIE 9451, Infrared Technology and Applications XLI, 94511S (26 May 2015); doi: 10.1117/12.2176615
Show Author Affiliations
G. P. Lindberg, Rochester Precision Optics, LLC (United States)
Univ. at Buffalo (United States)
J. Deegan, Rochester Precision Optics, LLC (United States)
R. Benson, Rochester Precision Optics, LLC (United States)
A. J Berger, The Institute of Optics, Univ. of Rochester (United States)
J. J Linden, The Institute of Optics, Univ. of Rochester (United States)
D. Gibson, U.S. Naval Research Lab. (United States)
S. Bayya, U.S. Naval Research Lab. (United States)
J. Sanghera, U.S. Naval Research Lab. (United States)
V. Nguyen, U.S. Naval Research Lab. (United States)
M. Kotov, Sotera Defense Solutions, Inc. (United States)


Published in SPIE Proceedings Vol. 9451:
Infrared Technology and Applications XLI
Bjørn F. Andresen; Gabor F. Fulop; Charles M. Hanson; Paul R. Norton, Editor(s)

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